"Graphene-related two-dimensional materials have attracted the attention of people in various fields the moment they appeared. The industrial application of graphene-related two-dimensional materials needs the support of a high-quality infrastructure system, including metrology, standardization, inspection and conformity assessment. In this book, the authors elaborate some key metrological results on graphene-related two-dimensional materials. For easier understanding, this book first describes the basic concepts of metrology, material metrology, and related metrological terms, such as traceability, uncertainty, error, and certified reference material (CRM). Metrological technology frameworks for quality evaluation of advanced materials including graphene-related materials are then proposed. Furthermore, the metrological techniques on structural characterization of graphene-related two-dimensional materials, such as Raman spectroscopy, X-ray diffraction, atomic force microscopy and electron microscopy, are introduced including the study of CRM, valid measurement method, interlaboratory comparison (ILC). Lastly, this book also describes the standardizations of the measurement methods of graphene-related two-dimensional materials, such as X-ray photoelectron spectroscopy, inductively coupled plasma mass spectrometry and Fourier transform infrared spectrometer based on ILC. As a result, accurate and consistent measurement results can be achieved through the established measurement standards, reference materials, and standard measurement methods. The worldwide equivalent results may ensure the quality of graphene products, promoting the standardization, mass production and sustainable and healthy developments of the graphene industry"--
