Fundamentals of Electromigration-Aware Integrated Circuit Design

Fundamentals of Electromigration-Aware Integrated Circuit Design

von

Lienig, JensThiele, Matthias

BuchGebunden

EUR130,00

BuchabEUR89,00

E-BookEUR90,94

In den Warenkorb

Produktbeschreibung

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration's negative impact on circuit reliability.

Details

ISBN/GTIN978-3-319-73557-3

ProduktartBuch

EinbandGebunden

VerlagSpringer

ErscheinungsortCham

ErscheinungslandSchweiz

Erscheinungsdatum07.03.2018

Auflage1st ed. 2018

Seiten159 Seiten

SpracheEnglisch

Illustrationen95 farbige Abbildungen, 4 s/w Abbildungen

Artikel-Nr.2314099

KatalogVLB

Datenquelle-Nr.b4578bb5ed2f4fe0b5d85b5c67721785

WarengruppeNaturwissenschaften, Medizin, Informatik, Technik | Technik | Elektronik, Elektrotechnik, Nachrichtentechnik

Weitere Details

Bewertungen

Kommentar verfassen

Autor/in

Lienig, JensThiele, Matthias

Jens Lienig is the director of the Institute of Electromechanical and Electronic Design at Dresden University of Technology, Germany. He received his Ph.D. in the field of computer-aided physical design of multi-chip modules and was employed as a researcher at University of Virginia, Charlottesville and Concordia University, Montreal. Afterwards he worked as project manager at Tanner Research, Inc. and Robert Bosch GmbH. His main research subjects are design of electronic systems and electronic design automation. He is a member of IEEE.

Matthias Thiele is a scientific assistant at Dresden University of Technology, Germany. He received his Ph.D. in the field of electromigration. Currently he works on the reliability of electronic and mechatronic systems.