Fundamentals of Electromigration-Aware Integrated Circuit Design

Fundamentals of Electromigration-Aware Integrated Circuit Design

von

Lienig, JensThiele, Matthias

BuchKartoniert, Paperback

EUR89,00

BuchabEUR89,00

E-BookEUR90,94

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Produktbeschreibung

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration's negative impact on circuit reliability.

Details

ISBN/GTIN978-3-030-08811-8

ProduktartBuch

EinbandKartoniert, Paperback

VerlagSpringer

ErscheinungsortCham

ErscheinungslandSchweiz

Erscheinungsdatum14.12.2018

AuflageSoftcover reprint of the original 1st ed. 2018

Seiten159 Seiten

SpracheEnglisch

Illustrationen4 s/w Abbildungen, 95 farbige Abbildungen

Artikel-Nr.2869727

KatalogVLB

Datenquelle-Nr.20e7abc9b6584a1a8d53396ee6f371a7

WarengruppeNaturwissenschaften, Medizin, Informatik, Technik | Technik | Elektronik, Elektrotechnik, Nachrichtentechnik

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Autor/in

Lienig, JensThiele, Matthias

Jens Lienig is the director of the Institute of Electromechanical and Electronic Design at Dresden University of Technology, Germany. He received his Ph.D. in the field of computer-aided physical design of multi-chip modules and was employed as a researcher at University of Virginia, Charlottesville and Concordia University, Montreal. Afterwards he worked as project manager at Tanner Research, Inc. and Robert Bosch GmbH. His main research subjects are design of electronic systems and electronic design automation. He is a member of IEEE.

Matthias Thiele is a scientific assistant at Dresden University of Technology, Germany. He received his Ph.D. in the field of electromigration. Currently he works on the reliability of electronic and mechatronic systems.